D Function, Pinout, and Drive Compatible
With FCT and F Logic
D Reduced VOH (Typically = 3.3 V) Versions
of Equivalent FCT Functions
D Edge-Rate Control Circuitry for
Significantly Improved Noise
D Ioff Supports Partial-Power-Down Mode
D ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
– 1000-V Charged-Device Model (C101)
D Matched Rise and Fall Times
D Fully Compatible With TTL Input and
Output Logic Levels
– 48-mA Output Sink Current
– 12-mA Output Source Current
– 64-mA Output Sink Current
– 32-mA Output Source Current
D 3-State Outputs
8-BIT BUFFERS/LINE DRIVERS
WITH 3-STATE OUTPUTS
SCCS072 – OCTOBER 2001
CY54FCT541T . . . D PACKAGE
CY74FCT541T . . . P, Q, OR SO PACKAGE
CY54FCT541T . . . L PACKAGE
3 2 1 20 19
9 10 11 12 13
The ’FCT541T noninverting buffers/line drivers
can be employed as memory address drivers,
clock drivers, and bus-oriented transmitters/receivers. These devices provide speed and drive capabilities
equivalent to their fastest bipolar-logic counterparts, while reducing power dissipation. The input and output
voltage levels allow direct interface with TTL, NMOS, and CMOS devices without external components.
These devices are fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the
outputs, preventing damaging current backflow through the device when it is powered down.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
•POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Copyright 2001, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.