SN54ABT8646 Datasheet | Texas Instruments

SN54ABT8646, SN74ABT8646 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS SCBS123F - AUGUST 1992 - REVISED APRIL 2004 D Members of the Texas Instruments SCOPE  Family of Testability Products D patible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Functionally Equivalent to ’F646 and ’ABT646 in the Normal-Function Mode D SCOPE  Instruction Set - IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ - Parallel-Signature Analysis at Inputs With Masking Option - Pseudorandom Pattern Generation From Outputs - Sample Inputs/Toggle Outputs - Binary Count From Outputs - Even-Parity Opcodes D Two...