Datasheet4U Logo Datasheet4U.com

SN54ABT8652 - SCAN TEST DEVICES

Description

The ’ABT8652 scan test devices with octal bus transceivers and registers are members of the Texas Instruments SCOPE™ testability integrated-circuit family.

This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies.

📥 Download Datasheet

Datasheet preview – SN54ABT8652

Datasheet Details

Part number SN54ABT8652
Manufacturer Texas Instruments
File Size 618.11 KB
Description SCAN TEST DEVICES
Datasheet download datasheet SN54ABT8652 Datasheet
Additional preview pages of the SN54ABT8652 datasheet.

📁 Similar Datasheet

  • SN54HC595J - 16-bit bus transceiver and transparant D-type latch (nexperia)
  • SN54LS00 - QUAD 2-INPUT NAND GATE (Motorola Inc)
  • SN54LS01 - QUAD 2-INPUT NAND GATE (Motorola Inc)
  • SN54LS02 - QUAD 2-INPUT NOR GATE (Motorola Inc)
  • SN54LS03 - QUAD 2-INPUT NAND GATE (Motorola Inc)
  • SN54LS04 - HEX INVERTER (Motorola Inc)
  • SN54LS05 - HEX INVERTER (Motorola Inc)
  • SN54LS08 - QUAD 2-INPUT AND GATE (Motorola Inc)
  • SN54LS09 - QUAD 2-INPUT AND GATE (Motorola Inc)
  • SN54LS10 - TRIPLE 3-INPUT NAND GATE (Motorola Inc)
Other Datasheets by Texas Instruments

Full PDF Text Transcription

Click to expand full text
SN54ABT8652, SN74ABT8652 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS SCBS122F – AUGUST 1992 – REVISED DECEMBER 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Functionally Equivalent to ’F652 and ’ABT652 in the Normal-Function Mode D SCOPE ™ Instruction Set – IEEE Standard 1149.
Published: |