Datasheet Details
| Part number | SN54ABT8646 |
|---|---|
| Manufacturer | Texas Instruments |
| File Size | 693.00 KB |
| Description | SCAN TEST DEVICES |
| Datasheet |
 SN54ABT8646 Datasheet
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| Part number | SN54ABT8646 |
|---|---|
| Manufacturer | Texas Instruments |
| File Size | 693.00 KB |
| Description | SCAN TEST DEVICES |
| Datasheet |
SN54ABT8646 Datasheet
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The ’ABT8646 and scan-test devices with octal bus transceivers and registers are members of the Texas Instruments SCOPE testability integrated-circuit family.
This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies.
Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
SN54ABT8646, SN74ABT8646 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS SCBS123F − AUGUST 1992 − REVISED APRIL 2004 D Members of the Texas Instruments SCOPE Family of Testability Products D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Functionally Equivalent to ’F646 and ’ABT646 in the Normal-Function Mode D SCOPE Instruction Set − IEEE Standard 1149.
| Part Number | Description |
|---|---|
| SN54ABT861 | 10-BIT TRANSCEIVERS |
| SN54ABT863 | 9-BIT BUS TRANSCEIVERS |
| SN54ABT8652 | SCAN TEST DEVICES |
| SN54ABT821 | 10-BIT BUS-INTERFACE FLIP-FLOPS |
| SN54ABT823 | 9-BIT BUS-INTERFACE FLIP-FLOPS |
| SN54ABT8245 | SCAN TEST DEVICES |
| SN54ABT827 | 10-Bit Buffer/Drivers |
| SN54ABT833 | 8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS |
| SN54ABT841 | 10-BIT BUS-INTERFACE D-TYPE LATCHES |
| SN54ABT843 | 9-BIT BUS-INTERFACE D-TYPE LATCHES |