SN54ABT8652 Datasheet | Texas Instruments

SN54ABT8652, SN74ABT8652 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS SCBS122F - AUGUST 1992 - REVISED DECEMBER 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D patible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Functionally Equivalent to ’F652 and ’ABT652 in the Normal-Function Mode D SCOPE ™ Instruction Set - IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ - Parallel-Signature Analysis at Inputs With Masking Option - Pseudo-Random Pattern Generation From Outputs - Sample Inputs/Toggle Outputs - Binary Count From Outputs - Even-Parity Opcodes D Two...