Datasheet Summary
SN54ABTH18502A, SN54ABTH182502A, SN74ABTH18502A, SN74ABTH182502A
SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS164E
- AUGUST 1993
- REVISED DECEMBER 1996
D Members of the Texas Instruments
SCOPE ™ Family of Testability Products
D Members of the Texas Instruments
Widebus ™ Family
D patible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
D UBT ™ (Universal Bus Transceiver) bines D-Type Latches and D-Type
Flip-Flops for Operation in Transparent,
Latched, or Clocked Mode
D Bus Hold on Data Inputs Eliminates the
Need for External Pullup Resistors
D B-Port Outputs of ’ABTH182502A Devices
Have Equivalent 25-Ω Series Resistors, So No...