• Part: SN74ABT18504
  • Description: SCAN TEST DEVICE
  • Manufacturer: Texas Instruments
  • Size: 778.48 KB
SN74ABT18504 Datasheet (PDF) Download
Texas Instruments
SN74ABT18504

Description

The SN54ABT18504 and SN74ABT18504 scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments SCOPE ™ testability IC family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of plex circuit board assemblies.