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SN74ABT18504 - SCAN TEST DEVICE

Description

The SN54ABT18504 and SN74ABT18504 scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments SCOPE ™ testability IC family.

This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies.

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Datasheet Details

Part number SN74ABT18504
Manufacturer Texas Instruments
File Size 778.48 KB
Description SCAN TEST DEVICE
Datasheet download datasheet SN74ABT18504 Datasheet
Additional preview pages of the SN74ABT18504 datasheet.

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Full PDF Text Transcription

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• Members of the Texas Instruments SCOPE ™ Family of Testability Products • Members of the Texas Instruments Widebus ™ Family • Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture • UBT ™ (Universal Bus Transceiver) Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode • Two Boundary-Scan Cells per I/O for Greater Flexibility • State-of-the-Art EPIC-ΙΙB ™ BiCMOS Design Significantly Reduces Power Dissipation SN54ABT18504, SN74ABT18504 SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS108B – AUGUST 1992 – REVISED JUNE 1993 • SCOPE ™ Instruction Set – IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, and P1149.
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