SN74ABT18502 Description
The SN74ABT18502 scan test device with an 18-bit universal bus transceiver is a member of the Texas Instruments SCOPE testability IC family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of plex circuit board assemblies. Scan access to the test circuitry is acplished via the four-wire test access port (TAP) interface.