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SN74ABT18502 - SCAN TEST DEVICE

Description

The SN74ABT18502 scan test device with an 18-bit universal bus transceiver is a member of the Texas Instruments SCOPE  testability IC family.

This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies.

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Datasheet Details

Part number SN74ABT18502
Manufacturer Texas Instruments
File Size 725.78 KB
Description SCAN TEST DEVICE
Datasheet download datasheet SN74ABT18502 Datasheet
Additional preview pages of the SN74ABT18502 datasheet.

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Full PDF Text Transcription

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SN74ABT18502 SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER SCBS753 – FEBRUARY 2002 D Member of the Texas Instruments Widebus Family D UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode D Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture D Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data D Two Boundary-Scan Cells (BSCs) Per I/O for Greater Flexibility D SCOPE Instruction Set – IEEE Std 1149.1-1990 Required Instructions, Optional INTEST, and P1149.
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