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SN74ABT18245A - SCAN TEST DEVICES

Description

The ’ABT18245A scan test devices with 18-bit bus transceivers are members of the Texas Instruments SCOPE™ testability integratedcircuit family.

This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies.

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Datasheet Details

Part number SN74ABT18245A
Manufacturer Texas Instruments
File Size 1.38 MB
Description SCAN TEST DEVICES
Datasheet download datasheet SN74ABT18245A Datasheet
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Full PDF Text Transcription

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SN54ABT18245A, SN74ABT18245A SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS SCBS110H – AUGUST 1992 – REVISED FEBRUARY 1999 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus™ Family D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D SCOPE ™ Instruction Set – IEEE Standard 1149.
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