Datasheet Details
| Part number | SN74ABT18640 |
|---|---|
| Manufacturer | Texas Instruments |
| File Size | 552.32 KB |
| Description | SCAN TEST DEVICE |
| Datasheet | SN74ABT18640-etcTI.pdf |
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Overview: SN54ABT18640, SN74ABT18640 SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS SCBS267C – FEBRUARY 1994 – REVISED JULY 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus™ Family D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D SCOPE ™ Instruction Set – IEEE Standard 1149.
| Part number | SN74ABT18640 |
|---|---|
| Manufacturer | Texas Instruments |
| File Size | 552.32 KB |
| Description | SCAN TEST DEVICE |
| Datasheet | SN74ABT18640-etcTI.pdf |
|
|
|
The ’ABT18640 scan test devices with 18-bit inverting bus transceivers are members of the Texas Instruments SCOPE™ testability integrated-circuit family.
This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies.
Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
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