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SN74ABT18640 - SCAN TEST DEVICE

Description

The ’ABT18640 scan test devices with 18-bit inverting bus transceivers are members of the Texas Instruments SCOPE™ testability integrated-circuit family.

This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies.

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Datasheet Details

Part number SN74ABT18640
Manufacturer Texas Instruments
File Size 552.32 KB
Description SCAN TEST DEVICE
Datasheet download datasheet SN74ABT18640 Datasheet
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Full PDF Text Transcription

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SN54ABT18640, SN74ABT18640 SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS SCBS267C – FEBRUARY 1994 – REVISED JULY 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus™ Family D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D SCOPE ™ Instruction Set – IEEE Standard 1149.
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