| Part number | SN74ABT18640 |
|---|---|
| Datasheet | SN74ABT18640-etcTI.pdf |
| File Size | 552.32 KB |
| Manufacturer | Texas Instruments |
| Description | SCAN TEST DEVICE |
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The ’ABT18640 scan test devices with 18-bit inverting bus transceivers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of plex circuit-board assemblies. Scan access to the test circuitry is acplished via the 4-wire test access port (TAP) interface.
See all Texas Instruments datasheets
| Part Number | Description |
|---|---|
| SN74ABT18646 | SCAN TEST DEVICE |
| SN74ABT18652 | SCAN TEST DEVICE |
| SN74ABT18245A | SCAN TEST DEVICES |
| SN74ABT18502 | SCAN TEST DEVICE |
| SN74ABT18504 | SCAN TEST DEVICE |
| SN74ABT125 | QUADRUPLE BUS BUFFER GATES |
| SN74ABT125Q-Q1 | QUADRUPLE BUS BUFFER GATE |
| SN74ABT126 | QUADRUPLE BUS BUFFER GATES |
| SN74ABT162244 | 16-BIT BUFFERS/DRIVERS |
| SN74ABT162245 | 16-Bit BUS TRANSCEIVERS |
