Datasheet Details
| Part number | SN74ABT18652 |
|---|---|
| Manufacturer | Texas Instruments |
| File Size | 500.35 KB |
| Description | SCAN TEST DEVICE |
| Datasheet | SN74ABT18652-etcTI.pdf |
|
|
Overview: D Member of the Texas Instruments Widebus Family D Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data D Two Boundary-Scan Cells Per I/O for Greater Flexibility SN74ABT18652 SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER SCBS132B – AUGUST 1992 – REVISED JANUARY 2002 D SCOPE Instruction Set – IEEE Std 1149.1-1990 Required Instructions, Optional INTEST, and P1149.
| Part number | SN74ABT18652 |
|---|---|
| Manufacturer | Texas Instruments |
| File Size | 500.35 KB |
| Description | SCAN TEST DEVICE |
| Datasheet | SN74ABT18652-etcTI.pdf |
|
|
|
This scan test device with an 18-bit bus transceiver and register is a member of the Texas Instruments SCOPE testability IC family.
This device supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies.
Scan access to the test circuitry is accomplished via the four-wire test access port (TAP) interface.
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