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SN74ABT18646 - SCAN TEST DEVICE

Description

This scan test device with a 18-bit bus transceiver and register is a member of the Texas Instruments SCOPE testability IC family.

This device supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies.

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Datasheet Details

Part number SN74ABT18646
Manufacturer Texas Instruments
File Size 499.52 KB
Description SCAN TEST DEVICE
Datasheet download datasheet SN74ABT18646 Datasheet
Additional preview pages of the SN74ABT18646 datasheet.

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Full PDF Text Transcription

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D Member of the Texas Instruments Widebus Family D Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data D Two Boundary-Scan Cells Per I/O for Greater Flexibility SN74ABT18646 SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER SCBS131A – AUGUST 1992 – REVISED JANUARY 2002 D SCOPE Instruction Set – IEEE Std 1149.1-1990 Required Instructions, Optional INTEST, and P1149.
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