SN74ABT18646 Datasheet | Texas Instruments

description This scan test device with a 18-bit bus transceiver and register is a member of the Texas Instruments SCOPE testability IC family. This device supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of plex circuit board assemblies. Scan access to the test circuitry is acplished via the four-wire test access port (TAP) interface. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SCOPE and Widebus are trademarks of Texas Instruments. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright  2002, Texas Instruments Incorporated - POST OFFICE BOX 655303 DALLAS, TEXAS 75265 SN74ABT18646 SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER SCBS131A - AUGUST 1992 - REVISED JANUARY 2002 description (continued) In the normal mode, this device is an 18-bit bus transceiver and register that allows for multiplexed transmission of data directly from the input bus or from the internal registers. It can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self-test on the boundary test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPE bus transceivers and registers. Transceiver function is controlled by output-enable (OE)...