SN74ABT18646 datasheet PDF for SCAN TEST DEVICE.
| Part number | SN74ABT18646 |
|---|---|
| Datasheet | SN74ABT18646-etcTI.pdf |
| File Size | 499.52 KB |
| Manufacturer | Texas Instruments |
| Description | SCAN TEST DEVICE |
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This scan test device with a 18-bit bus transceiver and register is a member of the Texas Instruments SCOPE testability IC family. This device supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of plex circuit board assemblies. Scan access to the test circuitry is acplished via the four-wire test access port (TAP) interface.
See all Texas Instruments datasheets
| Part Number | Description |
|---|---|
| SN74ABT18640 | SCAN TEST DEVICE |
| SN74ABT18652 | SCAN TEST DEVICE |
| SN74ABT18245A | SCAN TEST DEVICES |
| SN74ABT18502 | SCAN TEST DEVICE |
| SN74ABT18504 | SCAN TEST DEVICE |
| SN74ABT125 | QUADRUPLE BUS BUFFER GATES |
| SN74ABT125Q-Q1 | QUADRUPLE BUS BUFFER GATE |
| SN74ABT126 | QUADRUPLE BUS BUFFER GATES |
| SN74ABT162244 | 16-BIT BUFFERS/DRIVERS |
| SN74ABT162245 | 16-Bit BUS TRANSCEIVERS |
