SN54AHC00
SN74AHC00
SCLS227J – OCTOBER 1995 – REVISED MAY 2013
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ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted)(1)
VALUE
UNIT
Supply voltage range, VCC
Input voltage range, VI(2)
Output voltage range, VO(2)
Input clamp current, IIK (VI < 0)
Output clamp current, IOK (VO < 0 or VO > VCC)
Continuous output current, IO (VO = 0 to VCC)
Continuous current through VCC or GND
D package(3)
DB package(3)
DGV package(3)
Package thermal impedance, θJA
N package(3)
NS package(3)
PW package(3)
RGY package(4)
–0.5 to 7
–0.5 to 7
–0.5 to VCC + 0.5
–20
±20
±25
±50
86
96
127
80
76
113
47
V
V
V
mA
mA
mA
mA
°C/W
Storage temperature range, Tstg
–65 to 150
°C
(1) Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating
conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
(3) The package thermal impedance is calculated in accordance with JESD 51-7.
(4) The package thermal impedance is calculated in accordance with JESD 51-5
RECOMMENDED OPERATING CONDITIONS(1)
SN54AHC00
MIN
MAX
SN74AHC00
MIN
MAX
UNIT
VCC
Supply voltage
VIH
High-level input voltage
VIL
Low-level Input voltage
VI
Input voltage
VO
Output voltage
IOH
High-level output current
IOL
Low-level output current
Δt/Δv
TA
Input Transition rise or fall rate
Operating free-air temperature
VCC= 2 V
VCC= 3V
VCC= 5.5 V
VCC= 2 V
VCC= 3 V
VCC= 5.5 V
VCC= 2 V
VCC= 3.3 V ± 0.3 V
VCC= 5 V ± 0.5 V
VCC= 2 V
VCC= 3.3 V ± 0.3 V
VCC= 5 V ± 0.5 V
VCC= 3.3 V ± 0.3 V
VCC= 5 V ± 0.5 V
2
5.5
2
5.5
V
1.5
1.5
2.1
2.1
V
3.85
3.85
0.5
0.5
0.9
0.9
V
1.65
1.65
0
5.5
0
5.5
V
0
VCC
–50
0
VCC
V
–50
–4
–4
mA
–8
–8
50
50
4
4
mA
8
8
100
100
ns/V
20
20
–55
125
–40
125
°C
(1) All unused inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report,
Implications of Slow or Floating CMOS Inputs, literature number SCBA004.
2
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