| Part number | SN74BCT8240A |
|---|---|
| Datasheet | SN74BCT8240A-etcTI.pdf |
| File Size | 488.19 KB |
| Manufacturer | Texas Instruments |
| Description | SCAN TESTER |
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The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of plex circuit-board assemblies. Scan access to the test circuitry is acplished via the 4-wire test access port (TAP) interface.
See all Texas Instruments datasheets
| Part Number | Description |
|---|---|
| SN74BCT8244A | SCAN TESTER |
| SN74BCT8245A | SCAN TESTER |
| SN74BCT8373A | SCAN TESTER |
| SN74BCT8374A | SCAN TESTER |
| SN74BCT125A | QUADRUPLE BUS BUFFER GATES |
| SN74BCT125AN | QUADRUPLE BUS BUFFER GATES |
| SN74BCT126A | QUADRUPLE BUS BUFFER GATES |
| SN74BCT2240 | OCTAL BUFFERS AND LINE/MOS DRIVERS |
| SN74BCT2240N | OCTAL BUFFERS AND LINE/MOS DRIVERS |
| SN74BCT2244 | OCTAL BUFFERS AND LINE/MOS DRIVERS |
