SN74BCT8245A
SN74BCT8245A is SCAN TESTER manufactured by Texas Instruments.
description
The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE™ testability integratedcircuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of plex circuit-board assemblies. Scan access to the test circuitry is acplished via the 4-wire test access port (TAP) interface.
SN54BCT8245A . . . JT PACKAGE SN74BCT8245A . . . DW OR NT PACKAGE
(TOP VIEW)
DIR 1 B1 2 B2 3 B3 4 B4 5
GND 6 B5 7 B6 8 B7 9 B8 10
TDO 11 TMS 12
24 OE 23 A1 22 A2 21 A3 20 A4 19 A5 18 VCC 17 A6 16 A7 15 A8 14 TDI 13 TCK
SN54BCT8245A . . . FK PACKAGE (TOP VIEW)
A7
A6
A5
A4
A3
4 3 2 1 28 27 26
A2 5
25 A8
A1 6
24 TDI
OE 7
23 TCK
NC 8
22 NC
DIR 9
21 TMS
B1 10
20 TDO
B2 11
19 B8
12 13 14 15 16 17 18
B7
B6
B5
B4
B3...
