SN74BCT8240A Overview
Key Specifications
Package: SOIC
Mount Type: Surface Mount
Pins: 24
Max Voltage (typical range): 5.5 V
Description
The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies.