SN74BCT8240A Datasheet | Texas Instruments

description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of plex circuit-board assemblies. Scan access to the test circuitry is acplished via the 4-wire test access port (TAP) interface. SN54BCT8240A . . . JT PACKAGE SN74BCT8240A . . . DW OR NT PACKAGE (TOP VIEW) 1OE 1 1Y1 2 1Y2 3 1Y3 4 1Y4 5 GND 6 2Y1 7 2Y2 8 2Y3 9 2Y4 10 TDO 11 TMS 12 24 2OE 23 1A1 22 1A2 21 1A3 20 1A4 19 2A1 18 VCC 17 2A2 16 2A3 15 2A4 14 TDI 13 TCK SN54BCT8240A . . . FK PACKAGE (TOP VIEW) 2A3 2A2 2A1 1A4 1A3 1A2 1A1 2OE NC 1OE 1Y1 1Y2 4 3 2 1 28 27 26 12 13 14 15 16 17 18 2A4 TDI TCK NC TMS TDO 2Y4 2Y3 2Y2 2Y1 1Y4 1Y3...