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SN74HC10-EP - TRIPLE 3-INPUT POSITIVE-NAND GATE

Description

The SN74HC10 device contains three independent 3-input NAND gates.

B

C or Y = A + B + C in positive logic.

D 40°C to 1

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Datasheet preview – SN74HC10-EP

Datasheet Details

Part number SN74HC10-EP
Manufacturer Texas Instruments
File Size 856.79 KB
Description TRIPLE 3-INPUT POSITIVE-NAND GATE
Datasheet download datasheet SN74HC10-EP Datasheet
Additional preview pages of the SN74HC10-EP datasheet.

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Full PDF Text Transcription

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SN74HC10ĆEP TRIPLE 3ĆINPUT POSITIVEĆNAND GATE D Controlled Baseline − One Assembly/Test Site, One Fabrication Site D Extended Temperature Performance of −40°C to 125°C D Enhanced Diminishing Manufacturing Sources (DMS) Support D Enhanced Product-Change Notification D Qualification Pedigree† D Wide Operating Voltage Range of 2 V to 6 V † Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.
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