89C51ED2 Datasheet - ATMEL Corporation

89C51ED2 AT89C51ED2

Electrical Life Test (Early Failure Rate) 48 hours 140°C Electrical Life Test (Latent Failure Rate) 1000 hours 140°C Dynamic or Static Electrostatic Discharge HBM +/-2000v 1.5kOhm/100pF/3 pulses Latch up 50mW power injection, 50% overvoltage @125°C NVM Endurance Program Erase Cycles 25°C NVM Data Re.

AT89C51RD2 / AT89C51ED2 QualPack Qualification Package AT89C51ED2 FLASH 8-bit C51 Microcontroller 64 Kbytes FLASH, 2 Kbytes EEPROM www.DataSheet4U.com AT89C51RD2 / AT89C51ED2 JULY 2003 Rev. 0 2003 July 1 AT89C51RD2 / AT89C51ED2 QualPack 1 Table of contents 1 2 3 TABLE OF CONTENTS 2 GENERAL INFORMATION 3 TECHNOLOGY INFORMATION 4 3.1 WAFER PROCESS TECHNOLOGY 4 www.DataSheet4U.com 3.2 PRODUCT DESIGN 5 3.3 DEVICE CROSS SECTION 6 4 QUALIFICATION 7 4.1 QUALIFICATION METHODOLOGY .

89C51ED2 Datasheet (1.38 MB)