* s s s s s s s s s s s s s Radiation Hardened up to 1 x 10 5 Rads (Si) Single Event Burnout (SEB) Hardened Single Event Gate Rupture (SEGR) Hardened Gamma Dot (Flash X-Ray) Hardened Neutron Tolerant Identical Pre- and Post-Electrical Test Conditions Repetitive Avalanche Rating Dynamic dv/dt Rating
IRHM7264SE Datasheet (121.74 KB)
IRHM7264SE
IRF
121.74 KB
N-channel transistor.
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Provisional Data Sheet No. PD-9.1393A
REPETITIVE AVALANCHE AND dv/dt RATED
IRHM7264SE
N-CHANNEL
HEXFET® .
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