* s s s s s s s s s s s s s Radiation Hardened up to 1 x 10 5 Rads (Si) Single Event Burnout (SEB) Hardened Single Event Gate Rupture (SEGR) Hardened Gamma Dot (Flash X-Ray) Hardened Neutron Tolerant Identical Pre- and Post-Electrical Test Conditions Repetitive Avalanche Rating Dynamic dv/dt Rating
IRHM7450SE Datasheet (122.09 KB)
IRHM7450SE
IRF
122.09 KB
N-channel transistor.
Previous Datasheet Index Next Data Sheet Provisional Data Sheet No. PD-9.1223B REPETITIVE AVALANCHE AND dv/dt RATED HEXFET® TRANSISTOR IRHM7450SE.
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