D17P137ACT Datasheet - NEC

D17P137ACT UPD17P137ACT

Change of name µPD1713XA to µPD17134A subseries Correction of (2) Program memory write/verify mode in 1.4 PIN CONFIGURATION Change of Figure 3-2 Value of Program Counter after Instruction Partial correction of 3.2.2 On Execution of Branch Instruction (BR) Partial correction of 3.2.3 On During Execut.

www.DataSheet4U.com µPD17134A SUBSERIES 4-BIT SINGLE-CHIP MICROCONTROLLER µPD17134A µPD17135A µPD17136A µPD17137A µPD17P136A µPD17P137A © 1993 Document No. U11607EJ3V0UM00 (3rd edition) Date Published December 1996 N Printed in Japan NOTES FOR CMOS DEVICES 1 PRECAUTION AGAINST ESD FOR SEMICONDUCTORS Note: Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and ultimately degrade the device operation. Steps must be taken to stop generation of static .

D17P137ACT Features

* NEC devices are classified into the following three quality grades: "Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a customer designated “quality assurance program“ for a specific application. The recommended applications of a device dep

D17P137ACT_NEC.pdf