SN54ABTH182504A Datasheet - Texas Instruments

SN54ABTH182504A SCAN TEST DEVICES

The ’ABTH18504A and ’ABTH182504A scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assembli.

SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS165C AUGUST 1993 REVISED JULY 1996 D Members of the Texas Instruments SCOPE™ Family of Testability Products D Members of the Texas Instruments Widebus™ Family D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D UBT ™ (Universal Bus Transceiver) Combines D-Type Latches and D-Type Flip-Flops for Opera.

SN54ABTH182504A Datasheet (874.48 KB)