Datasheet Details
Part number:
SN54ABTH182646A, SN54ABTH18646A
Manufacturer:
File Size:
883.32 KB
Description:
Scan test devices.
Note:
This datasheet PDF includes multiple part numbers: SN54ABTH182646A, SN54ABTH18646A.
Please refer to the document for exact specifications by model.
SN54ABTH182646A, SN54ABTH18646A, SCAN TEST DEVICES
The ’ABTH18646A and ’ABTH182646A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family.
This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board ass
SN54ABTH18646A, SN54ABTH182646A, SN74ABTH18646A, SN74ABTH182646A SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS166D AUGUST 1993 REVISED JULY 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus ™ Family D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Include D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of
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