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SN74ABT8245

SCAN TEST DEVICES

SN74ABT8245 General Description

The ’ABT8245 scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test ci.

SN74ABT8245 Datasheet (1.11 MB)

Preview of SN74ABT8245 PDF

Datasheet Details

Part number:

SN74ABT8245

Manufacturer:

Texas Instruments ↗

File Size:

1.11 MB

Description:

Scan test devices.
SN54ABT8245, SN74ABT8245 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS124D

* AUGUST 1992

* REVISED DECEMBER 1996 D Members of th.

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SN74ABT8245 SCAN TEST DEVICES Texas Instruments

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