SN74ABT827
546.13kb
10-bit buffer/drivers. SN54ABT827 . . . JT PACKAGE SN74ABT827 . . . DB, DW, NT, OR PW PACKAGE (TOP VIEW) OE1 1 A1 2 A2 3 A3 4 A4 5 A5 6 A6 7 A7 8 A8 9 A9
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SN74ABT821A - 10-BIT BUS-INTERFACE FLIP-FLOPS
(Texas Instruments)
D State-of-the-Art EPIC-ΙΙB™ BiCMOS Design
Significantly Reduces Power Dissipation
D ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015
D Latc.
SN74ABT823 - 9-BIT BUS-INTERFACE FLIP-FLOPS
(Texas Instruments)
SN54ABT823, SN74ABT823
9-BIT BUS-INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS
SCBS158E – JANUARY 1991 – REVISED MAY 1997
D State-of-the-Art EPIC-ΙΙB™ Bi.
SN74ABT8245 - SCAN TEST DEVICES
(Texas Instruments)
SN54ABT8245, SN74ABT8245
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SCBS124D – AUGUST 1992 – REVISED DECEMBER 1996
D Members of the Texas Instrume.
SN74ABT833 - 8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS
(Texas Instruments)
D State-of-the-Art EPIC-ΙΙB™ BiCMOS Design
Significantly Reduces Power Dissipation
D ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Excee.
SN74ABT841A - 10-BIT BUS-INTERFACE D-TYPE LATCHES
(Texas Instruments)
D State-of-the-Art EPIC-ΙΙB™ BiCMOS Design
Significantly Reduces Power Dissipation
D ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Excee.
SN74ABT843 - 9-BIT BUS-INTERFACE D-TYPE LATCHES
(Texas Instruments)
SN54ABT843, SN74ABT843
9-BIT BUS-INTERFACE D-TYPE LATCHES WITH 3-STATE OUTPUTS
SCBS197D – FEBRUARY 1991 – REVISED MAY 1997
D State-of-the-Art EPIC-ΙΙ.
SN74ABT8543 - SCAN TEST DEVICES
(Texas Instruments)
SN54ABT8543, SN74ABT8543
SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
SCBS120E – AUGUST 1991 – REVISED JULY 1996
D Members of the Texas I.
SN74ABT861 - 10-BIT TRANSCEIVERS
(Texas Instruments)
D State-of-the-Art EPIC-ΙΙB™ BiCMOS Design
Significantly Reduces Power Dissipation
D ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Excee.
SN74ABT863 - 9-BIT BUS TRANSCEIVERS
(Texas Instruments)
D State-of-the-Art EPIC-ΙΙB™ BiCMOS Design
Significantly Reduces Power Dissipation
D Typical VOLP (Output Ground Bounce) < 1 V
at VCC = 5 V, TA = 25°C.
SN74ABT8646 - SCAN TEST DEVICES
(Texas Instruments)
SN54ABT8646, SN74ABT8646 SCAN TEST DEVICES WITH
OCTAL BUS TRANSCEIVERS AND REGISTERS SCBS123F − AUGUST 1992 − REVISED APRIL 2004
D Members of the Tex.