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89C51ED2 - AT89C51ED2

General Description

Electrical Life Test (Early Failure Rate) 48 hours 140°C Electrical Life Test (Latent Failure Rate) 1000 hours 140°C Dynamic or Static Electrostatic Discharge HBM +/-2000v 1.5kOhm/100pF/3 pulses Latch up 50mW power injection, 50% overvoltage @125°C NVM Endurance Program Erase Cycles 25°C NVM Data Re

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Full PDF Text Transcription (Reference)

The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.

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AT89C51RD2 / AT89C51ED2 QualPack Qualification Package AT89C51ED2 FLASH 8-bit C51 Microcontroller 64 Kbytes FLASH, 2 Kbytes EEPROM www.DataSheet4U.com AT89C51RD2 / AT89C51ED2 JULY 2003 Rev. 0 – 2003 July 1 AT89C51RD2 / AT89C51ED2 QualPack 1 Table of contents 1 2 3 TABLE OF CONTENTS............................................................................................................................................. 2 GENERAL INFORMATION...................................................................................................................................... 3 TECHNOLOGY INFORMATION ............................................................................................................................ 4 3.1 WAFER PROCESS TECHNOLOGY ..............................