Compensated Deuices Incorporated CD827
MONOLITHIC TEMPERATURE COMPENSATED ZENER REFERENCE CHIPS
MAXIMUM RATINGS
Operating Temperature: -65°C to +175°C Storage Temperature: -65°C to +175°C CD821 thru CD829A REVERSE LEAKAGE CURRENT lR = 2 µA @ 25°C & VR = 3 Vdc 22 MILSELECTRICAL CHARACTERISTICS
@ 25°C, unless otherwise specified. -55° TO +100° VOLTAGE EFFECTIVE TEMPERATURE TEMPERATURE STABILITY COEFFICIENT ∆VZT (Note 2) mV 96 96 48 48 19 19 20 9 9 10 5 5 % / °C 0.01 0.01 0.005 0.005 0.002 0.002 0.002 0.001 0.001 0.001 0.0005 0.0005 CDI TYPE NUMBER ZENER VOLTAGE V ZT @I ZT ZENER TEST CURRENT I ZT MAXIMUM ZENER IMPEDANCE ZZT (Note 1) Backside is not cathode and must be electrically isolated T = Metallization Test Pad VOLTS CD821 CD821A CD823 CD823A CD825 CD825A CD826 CD827 CD827A CD828 CD829 CD829A 5.9 - 6.5 5.9 - 6.5 5.9 - 6.5 5.9 - 6.5 5.9 - 6.5 5.9 - 6.5 5.9 - 6.5 5.9 - 6.5 5.9 - 6.5 6.2 - 6.9 5.9 - 6.5 5.9 - 6.5 mA 7.5 7.5 7.5 7.5 7.5 7.5 7.5 7.5 7.5 7.5 7.5 7.5 OHMS 15 10 15 10 15 10 15 15 10 15 15 10 DESIGN DATA METALLIZATION: Top: C (Cathode) ...................Al A (Anode) ......................