IRHM2C50SE
IRHM2C50SE is N-Channel Transistor manufactured by IRF.
feature all of the well-established advantages of MOSFETs, such as voltage control, very fast switching, ease of paralleling and temperature stability of the electrical parameters. They are well-suited for applications such as switching power supplies, motor controls, inverters, choppers, audio amplifiers and high-energy pulse circuits in space and weapons environments.
Product Summary
Part Number IRHM2C50SE IRHM7C50SE BV DSS 600V RDS(on) 0.60 Ω ID 10.4A
Features
: n n n n n n n n n n n n n
Radiation Hardened up to 1 x 10 5 Rads (Si) Single Event Burnout (SEB) Hardened Single Event Gate Rupture (SEGR) Hardened Gamma Dot (Flash X-Ray) Hardened Neutron Tolerant Identical Pre- and Post-Electrical Test Conditions Repetitive Avalanche Rating Dynamic dv/dt Rating Simple Drive Requirements Ease of Paralleling Hermetically Sealed Electrically Isolated Ceramic Eyelets
Absolute Maximum Ratings
Parameter
I D @ VGS = 12V, TC = 25°C Continuous Drain Current ID @ VGS = 12V, TC = 100°C Continuous Drain Current IDM Pulsed Drain Current PD @ TC = 25°C Max. Power Dissipation Linear Derating Factor VGS Gate-to-Source Voltage EAS Single Pulse Avalanche Energy I AR Avalanche Current EAR Repetitive Avalanche Energy dv/dt Peak Diode Recovery dv/dt
- TJ TSTG Operating Junction Storage Temperature Range Lead Temperature Weight 10.4 6.5 41.6 150 1.2 ±20 500 10.4 15 3.0 -55 to 150
Pre-Radiation
IRHM2C50SE, IRHM7C50SE Units A
W W/K
V m J A m J V/ns o C
300 (0.063 in (1.6 mm) from case for 10 sec) 9.3 (typical) g
To Order
Previous Datasheet
IRHM2C50SE, IRHM7C50SE Devices
Index
Next Data Sheet
Pre-Radiation
Electrical Characteristics @ Tj = 25°C (Unless Otherwise Specified)
Parameter
BVDSS ∆BVDSS/∆TJ RDS(on) VGS(th) gfs IDSS Drain-to-Source Breakdown Voltage Temperature Coefficient of Breakdown Voltage Static Drain-to-Source On-State Resistance Gate Threshold Voltage Forward Transconductance Zero Gate Voltage Drain Current
Min
- -
- 2.5 3.0
- -
- -
- -
- -
- -
- -
- Typ...