IS65WVS5128GALL
IS65WVS5128GALL is FAST SERIAL SRAM manufactured by ISSI.
FEATURES
- SPI-patible Bus Interface:
- 30/45 MHz Clock rate
- SPI/SDI/SQI mode
- Single Power Supply:
- VDD = 1.65V
- 2.2V (IS62/65WVS5128GALL)
- VDD = 2.70V
- 3.6V (IS62/65WVS5128GBLL)
- Read Latency:
- SPI mode: 8 clocks
- DPI mode: 4 clocks
- QPI mode: 2 clocks
- Low-Power CMOS Technology:
- Read Current: 20 m A(max) at 3.6V, 45 MHz, 85°C
- CMOS Standby Current: 8 A(typ)
- 512K x 8-bit Organization:
- 32-byte page
- Byte, Page and Sequential mode for Reads and Writes
- Temperature Ranges Supported:
- Industrial (I):
-40C to +85C
- Automotive (A3): -40C to +125C
- Ro HS pliant
- 8-pin SOIC package
DESCRIPTION
The ISSI IS62/65WVS5128GALL/GBLL are 4M bit Fast Serial static RAMs organized as 512K bytes by 8 bits. It is a dual die stack of two 2Mb Serial SRAMs.
The device is accessed via a simple Serial Peripheral Interface (SPI) patible serial bus. The bus signals required are a clock input (SCK) plus separate data in (SI) and data out (SO) lines. Access the device is controlled through a Chip Select (CS#) input. Additionally, SDI (Serial Dual Interface) and SQI (Serial Quad Interface) is supported if your application needs faster data rates.
This device also supports unlimited reads and writes to the memory array.
The IS62/65WVS5128GALL/GBLL are available in the standard 8-pin SOIC package.
Copyright © 2020 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to obtain the latest version of this device specification before relying on any published information and before placing orders for products. Integrated Silicon Solution, Inc. does not remend the use of any of its products in life support applications where the failure or malfunction of the product can reasonably be expected to cause failure of...