Datasheet Summary
TM ACS00MS
April 1995
Radiation Hardened Quad 2-Input NAND Gate
Features
- 1.25 Micron Radiation Hardened SOS CMOS
- Total Dose 300K RAD (Si)
- Single Event Upset (SEU) Immunity <1 x 10-10 Errors/Bit-Day (Typ)
- SEU LET Threshold >80 MEV-cm2/mg
- Dose Rate Upset >1011 RAD (Si)/s, 20ns Pulse
- Latch-Up Free Under Any Conditions
- Military Temperature Range: -55oC to +125oC
- Significant Power Reduction pared to ALSTTL Logic
- DC Operating Voltage Range: 4.5V to 5.5V
- Input Logic Levels
- VIL = 30% of VCC Max
- VIH = 70% of VCC Min
- Input Current ≤1µA at VOL, VOH
Description
The Intersil ACS00MS is a Radiation Hardened quad 2-Input NAND gate. A high logic level on both inputs forces...