ACS573MS Description
The outputs are transparent to the inputs when the latch enable (LE) is High. When the latch goes low the data is latched. The output enable controls the three-state outputs.
ACS573MS Key Features
- Devices QML Qualified in Accordance with MIL-PRF-38535
- Detailed Electrical and Screening Requirements are Contained in SMD# 5962-96724 and Intersil’s QM Plan
- 1.25 Micron Radiation Hardened SOS CMOS
- Total Dose
- >300K RAD (Si)
- Single Event Upset (SEU) Immunity: <1 x 10-10 Errors/Bit/Day (Typ)
- SEU LET Threshold
- >100 MEV-cm2/mg
- Dose Rate Upset
- Dose Rate Survivability