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HCS373T - Radiation Hardened Octal Transparent Latch/ Three-State

General Description

only.

Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice.

Accordingly, the reader is cautioned to verify that data sheets are current before placing orders.

Key Features

  • QML Class T, Per MIL-PRF-38535.
  • Radiation Performance - Gamma Dose (γ) 1 x 105 RAD(Si) - Latch-Up Free Under Any Conditions - SEP Effective LET No Upsets: >100 MEV-cm2/mg - Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/Bit-Day (Typ).
  • 3 Micron Radiation Hardened CMOS SOS.
  • Significant Power Reduction Compared to LSTTL ICs.
  • DC Operating Voltage Range: 4.5V to 5.5V.
  • Input Logic Levels - VIL = 0.3 VCC Max - VIH = 0.7 VCC Min.
  • Input.

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Other Datasheets by Intersil (now Renesas)

Part Number Description
HCS373MS Radiation Hardened Octal Transparent Latch/ Three-State
HCS374MS Radiation Hardened Octal D-Type Flip-Flop/ Three-State/ Positive Edge Triggered
HCS32MS Radiation Hardened Quad 2-Input OR Gate
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Full PDF Text Transcription (Reference)

The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.

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HCS373T Data Sheet July 1999 File Number 4617.1 Radiation Hardened Octal Transparent Latch, Three-State Intersil’s Satellite Applications FlowTM (SAF) devices are fully tested and guaranteed to 100kRAD total dose. These QML Class T devices are processed to a standard flow intended to meet the cost and shorter lead-time needs of large volume satellite manufacturers, while maintaining a high level of reliability. The Intersil HCS373T is a Radiation Hardened Octal Transparent Three-State Latch with an active-low output enable. The HCS373T utilizes advanced CMOS/SOS technology. The outputs are transparent to the inputs when the Latch Enable (LE) is HIGH. When the Latch Enable (LE) goes LOW, the data is latched. The Output Enable (OE) controls the three-state outputs.