Datasheet Summary
Radiation Hardened EDAC (Error Detection and Correction)
FN3204 Rev 1.00 January 1996
Features
- Devices QML Qualified in Accordance with MIL-PRF-38535
- Detailed Electrical and Screening Requirements are Contained in SMD# 5962-96721 and Intersil’s QM Plan
- 1.25 Micron Radiation Hardened SOS CMOS
- Total Dose >300K RAD (Si)
- Single Event Upset (SEU) Immunity: <1 x 10-10 Errors/
Bit/Day (Typ)
- SEU LET Threshold>100 MEV-cm2/mg
- Dose Rate Upset>1011 RAD (Si)/s, 20ns Pulse
- Dose Rate Survivability>1012 RAD (Si)/s, 20ns Pulse
- Latch-Up Free Under Any Conditions
- Military Temperature Range-55oC to +125oC
- Significant Power Reduction pared to ALSTTL Logic
- DC...