SY100E193
SY100E193 is ERROR DETECTION/ CORRECTION CIRCUIT manufactured by Micrel Semiconductor.
Micrel, Inc.
ERROR DETECTION/ CORRECTION CIRCUIT
SY10E193
SY1S0YE10109E3193 SY100E193
Features s Hamming code generation s Extended 100E VEE range of
- 4.2V to
- 5.5V s 8-bit wide s Expandable for more width s Provides parity register s Fully patible with industry standard 10KH,
100K ECL levels s Internal75KΩ input pulldown resistors s Fully patible with Motorola MC10E/100E193 s Available in 28-pin PLCC package
DESCRIPTION
The SY10/100E193 are error detection and correction (EDAC) circuits designed for use in new, high- performance ECL systems. The E193 generates hamming parity codes on an 8-bit word as shown in the block diagram. The P5 output gives the parity of the whole word. PGEN provides word parity after Odd/Even parity control and gating with the BPAR input. PGEN also feeds into a 1-bit shiftable register for use as part of a scan ring.
The binatorial part of the device generates the same code pattern as the Motorola MC10193.
Used in conjunction with 12-bit parity generators, such as the E160, a SECDED (single error correction, double error detection) error system can be designed for a multiple of an 8-bit word.
PIN NAMES
Pin B0- B7 BPAR EV/OD EN HOLD S-IN SHIFT CLK P1- P5 PGEN PARERR/PARERR VCCO
Function Check Bit Inputs Check Bit Parity Input Even/Odd Parity Select Parity Enable Syndrome Hold Input Syndrome Bit Input Syndrome Bit Shift Clock Input Parity Output Parity Generate Output Parity Error Output VCC to Output
M9999-032006 hbwhelp@micrel. or (408) 955-1690
Rev.: F
Amendment: /0
Issue Date: March 2006
Micrel, Inc.
SY10E193 SY100E193
PACKAGE/ORDERING INFORMATION
EV/OD BPAR
B0 VEE
B1 B2 B3
EN HOLD S-IN SHIFT CLK VCCO PGEN
25 24 23 22 21 20 19
26 18
27 17
28 TOP VIEW...