D70F3033B Description
U13850EJ6V0UD00 (6th edition) Date Published February 2003 N CP(K) 1999, 2000, 2003 Printed in Japan [MEMO] .. 2 User’s Manual U13850EJ6V0UD NOTES FOR CMOS DEVICES 1 PRECAUTION AGAINST ESD FOR SEMICONDUCTORS Note: Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and ultimately degrade the device operation.