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DM74LS107A Datasheet Dual Negative-edge- Triggered Master-slave J-k Flip-flops

Manufacturer: National Semiconductor (now Texas Instruments)

Overview: DM54LS107A DM74LS107A Dual Negative-Edge-Triggered Master-Slave J-K Flip-Flops with Clear and plementary Outputs June 1989 DM54LS107A DM74LS107A Dual Negative-EdgeTriggered Master-Slave J-K Flip-Flops with Clear and.

General Description

This device contains two independent negative-edge-triggered J-K flip-flops with plementary outputs The J and K data is processed by the flip-flops on the falling edge of the clock pulse The clock triggering occurs at a voltage level and is not directly related to the transition time of the negative going edge of the clock pulse The data on the J and K inputs may change while the clock is high or low without affecting the outputs as long as setup and hold times are not violated A low logic level on the clear input will reset the outputs regardless of the logic levels of the other inputs Connection Diagram Dual-In-Line Package TL F 6367 – 1 Order Number DM54LS107AJ DM54LS107AW DM74LS107AM or DM74LS107AN See NS Package Number J14A M14A N14A or W14B Function Table Inputs CLR L H H H H H CLK X J X L H L H X K X L L H H X Q L Q0 H L Toggle Q0 Q0 Outputs Q H Q0 L H v v v v H H e High Logic Level X e Either Low or High Logic Level L e Low Logic Level v e Negative going edge of pulse Q0 e The output logic level before the indicated input conditions were established Toggle e Each output changes to the plement of its previous level on each falling edge of the clock pulse C1995 National Semiconductor Corporation TL F 6367 RRD-B30M105 Printed in U S A Absolute Maximum Ratings (Note) If Military Aerospace specified devices are required please contact the National Semiconductor Sales Office Distributors for availability and specifications Supply Voltage 7V Input Voltage 7V Operating Free Air Temperature Range b 55 C to a 125 C DM54LS DM74LS 0 C to a 70 C b 65 C to a 150 C Storage Temperature Range Note The ‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaran

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