SCANPSC110F
Overview
The SCANPSC110F Bridge extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a hierarchical approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to the remaining modules.
- True IEEE1149.1 hierarchical and multidrop addressable capability Connection Diagrams 28-Pin CDIP and Flatpak Pin Assignment for LCC
