Download MNCLC501A-X Datasheet PDF
National Semiconductor
MNCLC501A-X
MNCLC501A-X is HIGH-SPEED OUTPUT CLAMPING OP AMP manufactured by National Semiconductor.
Description The CLC501 is a high-speed current-feedback op amp with the unique feature of output voltage clamping. This feature allows both the maximum positive (Vhigh) and negative (Vlow) output voltage levels to be established. This is useful in a number of applications in which "downstream" circuitry must be protected from overdriving input signals. Not only can this prevent damage to downstream circuitry, but can also reduce time delays since saturation is avoided. The CLC501's very fast 1ns overload/clamping recovery time is useful in applications in which information-containing signals follow overdriving signals. Engineers designing high-resolution, subranging A/D systems have long sought an amplifier capable of meeting the demanding requirements of the residue amplifier function. Amplifiers providing the residue function must not only settle quickly, but recover from overdrive quickly, protect the second stage A/D, and provide high fidelity at relatively high gain settings. The CLC501, which excels in these areas, is the ideal design solution in this onerous application. To further support this application, the CLC501 is both characterized and tested at a gain setting of +32, the most mon gain setting for residue amplifier applications. The CLC501's other features provide a quick, high-performance design solution. Since the CLC501's current feedback design requires no external pensation, designers need not spend their time designing pensation networks. The small 8-pin package and low, 180m W power consumption make the CLC501 ideal in numerous applications having small power and size budgets. Original Creation Date: 08/06/98 Last Update Date: 03/09/99 Last Major Revision Date: 02/26/99 Industry Part Number CLC501A NS Part Numbers CLC501AJ-MLS CLC501AJ-QML- CLC501AWG-MLS CLC501AWG-QML- - Prime Die UB1148C Controlling Document 5962-8997401PA- ,MXA- - Processing MIL-STD-883, Method 5004 Subgrp Description 1 2 3 4 5 6 7 8A 8B 9 10 11 Static tests at Static...