SCAN18245T Datasheet | National Semiconductor

Description The SCAN18245T is a high speed, low-power bidirectional line driver featuring separate data inputs organized into dual 9-bit bytes with byte-oriented output enable and direction control signals. This device is pliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK). Features n n n n n n n n n n n IEEE 1149.1 (JTAG) pliant Dual output enable control signals TRI-STATE outputs for bus-oriented applications 9-bit data busses for parity applications Reduced-swing outputs source 24 m A/sink 48 m A Guaranteed to drive 50Ω transmission line to TTL input levels of 0.8V and 2.0V TTL patible inputs 25 mil pitch Cerpack package Includes CLAMP and HIGHZ instructions Available as Known Good Die Standard Microcircuit Drawing (SMD) 5962-9311501 Connection Diagram Pin Names B1(0- 8) A2(0- 8) B2(0- 8) G1, G2 DIR1, DIR2 Description Side B1 Inputs or TRI-STATE Outputs Side A2 Inputs or TRI-STATE Outputs Side B2 Inputs or TRI-STATE Outputs Output Enable Pins Direction of Data Flow Pins DS100320-1 Pin Names A1(0- 8) Description Side A1 Inputs or TRI-STATE Outputs TRI-STATE ® is a registered trademark of National Semiconductor Corporation. © 1998 National Semiconductor Corporation DS100320 .national. Truth Tables Inputs G1 L L L L H DIR1 L L H H X A1 (0- 8) H L H L Z A2 (0- 8) H L H L Z ← ← → → ← ← → → B1 (0- 8) H L H L Z B2 (0- 8) H L H L Z Inputs G2 L L L L H DIR2 L L H H X H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial Z = High Impedance Functional Description The SCAN18245 consists of two sets of nine non-inverting bidirectional buffers with TRI-STATE outputs and is intended for bus-oriented applications. Direction pins (DIR1 and DIR2) LOW enables data from B ports to A ports, when HIGH enables data from A ports to B ports. The Output Enable pins...