• Part: LM26LV
  • Description: WSON-6 Factory Preset Temperature Switch and Temperature Sensor
  • Manufacturer: Texas Instruments
  • Size: 1.79 MB
Download LM26LV Datasheet PDF
Texas Instruments
LM26LV
LM26LV is WSON-6 Factory Preset Temperature Switch and Temperature Sensor manufactured by Texas Instruments.
Features - 1 Low 1.6-V Operation - Low Quiescent Current - Latching Function: Device Can Latch the Over Temperature Condition - Push-Pull and Open-Drain Temperature Switch Outputs - Wide Trip Point Range of 0°C to 150°C - Very Linear Analog VTEMP Temperature Sensor Output - VTEMP Output Short-Circuit Protected - Accurate Over - 50°C to 150°C Temperature Range - Excellent Power Supply Noise Rejection - LM26LVQISD-130 and LM26LVQISD-135 are AEC-Q100 Qualified and are Manufactured on an Automotive Grade Flow: - Device Temperature Grade 0: - 40°C to 150°C Ambient Operating Temperature Range - Device HBM ESD Classification Level 3 A - Device CDM ESD Classification Level C6 - Device MM ESD Classification Level M3 2 Applications - Cell Phones and Wireless Transceivers - Digital Cameras - Battery Management Systems - Automotive Applications - Disk Drives - Games and Appliances Redundant Protection and Monitoring 3 Description The LM26LV and LM26LV-Q1 are low-voltage, precision, dual-output, low-power temperature switches and temperature sensors. The temperature trip point (TTRIP) can be preset at the factory to any temperature in the range of 0°C to 150°C in 1°C increments. Built-in temperature hysteresis (THYST) keeps the output stable in an environment of temperature instability. In normal operation the LM26LV or LM26LV-Q1 temperature switch outputs assert when the die temperature exceeds TTRIP. The temperature switch outputs will reset when the temperature falls below a temperature equal to (TTRIP - THYST). The OVERTEMP digital output, is active-high with a pushpull structure, while the OVERTEMP digital output, is active-low with an open-drain structure. The analog output, VTEMP, delivers an analog output voltage with Negative Temperature Coefficient (NTC). Driving the TRIP_TEST input high causes the digital outputs to be asserted for in-situ verification and causes the threshold voltage to appear at the VTEMP output pin, which could be used to verify the temperature trip...