• Part: SCAN15MB200
  • Description: Dual 1.5 Gbps 2:1/1:2 LVDS Mux/Buffer
  • Manufacturer: Texas Instruments
  • Size: 518.88 KB
Download SCAN15MB200 Datasheet PDF
Texas Instruments
SCAN15MB200
SCAN15MB200 is Dual 1.5 Gbps 2:1/1:2 LVDS Mux/Buffer manufactured by Texas Instruments.
FEATURES - 2 1.5 Gbps Data Rate Per Channel - Configurable Off/On Pre-emphasis Drives Lossy Backplanes and Cables - LVDS/BLVDS/CML/LVPECL patible Inputs, LVDS patible Outputs - Low Output Skew and Jitter - On-chip 100Ω Input and Output Termination - IEEE 1149.1 and 1149.6 pliant - 15 k V ESD Protection on LVDS Inputs/Outputs - Hot Plug Protection - Single 3.3V Supply - Industrial -40 to +85°C Temperature Range - 48-Pin WQFN Package DESCRIPTION The SCAN15MB200 is a dual-port 2 to 1 multiplexer and 1 to 2 repeater/buffer. High-speed data paths and flow-through pinout minimize internal device jitter and simplify board layout, while pre-emphasis overes ISI jitter effects from lossy backplanes and cables. The differential inputs and outputs interface to LVDS or Bus LVDS signals such as those on TI's 10-, 16-, and 18- bit Bus LVDS Ser Des, or to CML or LVPECL signals. Integrated IEEE 1149.1 (JTAG) and 1149.6 circuitry supports testability of both single-ended LVTTL/CMOS and high-speed differential PCB interconnects. The 3.3V supply, CMOS process, and robust I/O ensure high performance at low power over the entire industrial -40 to +85°C temperature range. Typical Application Switch Fabric A Switch Fabric B Backplane or Cable LVDS LVDS Mux Buffer FPGA or ASIC Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. All trademarks are the property of their respective owners. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 2005- 2013, Texas Instruments Incorporated SNLS188E - NOVEMBER 2005 - REVISED APRIL 2013 Block Diagram PREA_0 ENA_0 PREB_0 ENB_0 .ti. LI_0 SOA_0 PREL_0...