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SCANSTA101 Datasheet

Manufacturer: Texas Instruments
SCANSTA101 datasheet preview

Datasheet Details

Part number SCANSTA101
Datasheet SCANSTA101-etcTI.pdf
File Size 918.61 KB
Manufacturer Texas Instruments
Description Low Voltage IEEE 1149.1 System Test Access Master
SCANSTA101 page 2 SCANSTA101 page 3

SCANSTA101 Overview

The SCANSTA101 is designed to function as a test master for an IEEE 1149.1 boundary scan test system. It is suitable for use in embedded IEEE 1149.1 applications and as a ponent in a standalone boundary scan tester. The SCANSTA101 is an enhanced version of, and a replacement for, the SCANPSC100.

SCANSTA101 Key Features

  • 2 patible with IEEE Std. 1149.1 (JTAG) Test Access Port and Boundary Scan Architecture
  • Supported by Texas Instruments' SCAN Ease (SCAN Embedded Application Software Enabler) Software Rev 2.0
  • Uses Generic, Asynchronous Processor Interface; patible with a Wide Range of Processors and Processor Clock (PCLK) Frequ
  • 16-Bit Data Interface (IP Scalable to 32-bit)
  • 2k x 32 Bit Dual-Port Memory
  • Load-on-the-Fly (LotF) and Preloaded Vector Operating Modes Supported
  • On-Board Sequencer Allows Multi-Vector Operations such as those Required to Load Data Into an FPGA
  • On-Board pares Support Test Data In (TDI) Validation Against Preloaded Expected Data
  • 32-Bit Linear Feedback Shift Register (LFSR) at the Test Data In (TDI) Port for Signature pression
  • State, Shift, and BIST Macros Allow Predetermined Test Mode Select (TMS) Sequences to be Utilized

SCANSTA101 from other manufacturers

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Brand Logo Part Number Description Other Manufacturers
National Semiconductor Logo SCANSTA101 Low Voltage IEEE 1149.1 STA Master National Semiconductor
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