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SCANSTA101 Datasheet Low Voltage IEEE 1149.1 System Test Access Master

Manufacturer: Texas Instruments

General Description

The SCANSTA101 is designed to function as a test master for an IEEE 1149.1 boundary scan test system.

It is suitable for use in embedded IEEE 1149.1 applications and as a component in a standalone boundary scan tester.

The SCANSTA101 is an enhanced version of, and a replacement for, the SCANPSC100.

Overview

SCANSTA101 www.ti.com SNLS057J – MAY 2002 – REVISED APRIL 2013 SCANSTA101 Low Voltage IEEE 1149.

Key Features

  • 1.
  • 2 Compatible with IEEE Std. 1149.1 (JTAG) Test Access Port and Boundary Scan Architecture.
  • Supported by Texas Instruments' SCAN Ease (SCAN Embedded.