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SCANSTA101 - Low Voltage IEEE 1149.1 System Test Access Master

Description

The SCANSTA101 is designed to function as a test master for an IEEE 1149.1 boundary scan test system.

It is suitable for use in embedded IEEE 1149.1 applications and as a component in a standalone boundary scan tester.

The SCANSTA101 is an enhanced version of, and a replacement for, the SCANPSC100.

Features

  • 1.
  • 2 Compatible with IEEE Std. 1149.1 (JTAG) Test Access Port and Boundary Scan Architecture.
  • Supported by Texas Instruments' SCAN Ease (SCAN Embedded.

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Datasheet preview – SCANSTA101

Datasheet Details

Part number SCANSTA101
Manufacturer Texas Instruments
File Size 918.61 KB
Description Low Voltage IEEE 1149.1 System Test Access Master
Datasheet download datasheet SCANSTA101 Datasheet
Additional preview pages of the SCANSTA101 datasheet.

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Full PDF Text Transcription

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SCANSTA101 www.ti.com SNLS057J – MAY 2002 – REVISED APRIL 2013 SCANSTA101 Low Voltage IEEE 1149.1 System Test Access (STA) Master Check for Samples: SCANSTA101 FEATURES 1 •2 Compatible with IEEE Std. 1149.1 (JTAG) Test Access Port and Boundary Scan Architecture • Supported by Texas Instruments' SCAN Ease (SCAN Embedded Application Software Enabler) Software Rev 2.
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