Texas Instruments SCANSTA111
The SCANSTA111 extends the IEEE Std. The advantage of a multidrop approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to the remaining modules. Each SCANSTA111 supports up to 3 local IEEE 1149.1 scan rings which can be accessed individually or combined serially.FEATURES
1●2 True IEEE 1149.1 Hierarchical and Multidrop Addressable Capability
● The 7 Slot Inputs Support Up to 121 Unique Addresses, an Interrogation Address, Broadcast Address, and 4 Multi-Cast Group Addresses (Address 000000 is Reserved)
● 3 IEEE 1149.1-Compatible Configurable Local Scan Ports
● Mode Register0 Allows Local TAPs to be Bypassed, Selected for Insertion Into the Scan Chain Individually, or Serially in Groups of Two or Three
● Transparent Mode can be Enabled with a Single Instruction to Conveniently Buffer the Backplane IEEE 1149.1 Pins to those on a Single Local Scan Port
● LSP ACTIVE Outputs Provide Local Port Enable Signals for Analog Busses Supporting IEEE 1149.4.
● General Purpose Local Port Pass-Through Bits are Useful for Delivering Write Pulses for FPGA Programming or Monitoring Device Status.
● Known Power-Up State
● TRST on All Local Scan Ports
● 32-Bit TCK Counter
● 16-Bit LFSR Signature Compactor
● Local TAPs can become TRI-STATE via the OE Input to Allow...