• Part: SCANSTA111
  • Description: Enhanced SCAN Bridge Multidrop Addressable IEEE 1149.1 Port
  • Manufacturer: Texas Instruments
  • Size: 1.17 MB
SCANSTA111 Datasheet (PDF) Download
Texas Instruments
SCANSTA111

Overview

The SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a multidrop approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to the remaining modules.

  • 2 True IEEE 1149.1 Hierarchical and Multidrop Addressable Capability
  • The 7 Slot Inputs Support Up to 121 Unique Addresses, an Interrogation Address, Broadcast Address, and 4 Multi-Cast Group Addresses (Address 000000 is Reserved)
  • 3 IEEE 1149.1-Compatible Configurable Local Scan Ports
  • Mode Register0 Allows Local TAPs to be Bypassed, Selected for Insertion Into the Scan Chain Individually, or Serially in Groups of Two or Three
  • Transparent Mode can be Enabled with a Single Instruction to Conveniently Buffer the Backplane IEEE 1149.1 Pins to those on a Single Local Scan Port
  • LSP ACTIVE Outputs Provide Local Port Enable Signals for Analog Busses Supporting IEEE 1149.4.
  • General Purpose Local Port Pass-Through Bits are Useful for Delivering Write Pulses for FPGA Programming or Monitoring Device Status.
  • Known Power-Up State
  • TRST on All Local Scan Ports
  • 32-Bit TCK Counter