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SCANSTA111 Datasheet PDF

Texas Instruments SCANSTA111

The SCANSTA111 extends the IEEE Std. The advantage of a multidrop approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to the remaining modules. Each SCANSTA111 supports up to 3 local IEEE 1149.1 scan rings which can be accessed individually or combined serially.
Part No. SCANSTA111
Datasheet SCANSTA111 Download
Manufacturer
Texas Instruments
Description Enhanced SCAN Bridge Multidrop Addressable IEEE 1149.1 Port
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SCANSTA111 datasheet page 1 preview

FEATURES

1
●2 True IEEE 1149.1 Hierarchical and Multidrop Addressable Capability
● The 7 Slot Inputs Support Up to 121 Unique Addresses, an Interrogation Address, Broadcast Address, and 4 Multi-Cast Group Addresses (Address 000000 is Reserved)
● 3 IEEE 1149.1-Compatible Configurable Local Scan Ports
● Mode Register0 Allows Local TAPs to be Bypassed, Selected for Insertion Into the Scan Chain Individually, or Serially in Groups of Two or Three
● Transparent Mode can be Enabled with a Single Instruction to Conveniently Buffer the Backplane IEEE 1149.1 Pins to those on a Single Local Scan Port
● LSP ACTIVE Outputs Provide Local Port Enable Signals for Analog Busses Supporting IEEE 1149.4.
● General Purpose Local Port Pass-Through Bits are Useful for Delivering Write Pulses for FPGA Programming or Monitoring Device Status.
● Known Power-Up State
● TRST on All Local Scan Ports
● 32-Bit TCK Counter
● 16-Bit LFSR Signature Compactor
● Local TAPs can become TRI-STATE via the OE Input to Allow...
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