SCANSTA111 Description
The SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a multidrop approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to the remaining modules.
SCANSTA111 Key Features
- 2 True IEEE 1149.1 Hierarchical and Multidrop Addressable Capability
- The 7 Slot Inputs Support Up to 121 Unique Addresses, an Interrogation Address, Broadcast Address, and 4 Multi-Cast Grou
- 3 IEEE 1149.1-patible Configurable Local Scan Ports
- Mode Register0 Allows Local TAPs to be Bypassed, Selected for Insertion Into the Scan Chain Individually, or Serially in
- Transparent Mode can be Enabled with a Single Instruction to Conveniently Buffer the Backplane IEEE 1149.1 Pins to those
- LSP ACTIVE Outputs Provide Local Port Enable Signals for Analog Busses Supporting IEEE 1149.4
- General Purpose Local Port Pass-Through Bits are Useful for Delivering Write Pulses for FPGA Programming or Monitoring D
- Known Power-Up State
- TRST on All Local Scan Ports
- 32-Bit TCK Counter