SCANSTA111 Datasheet | National Semiconductor

SCANSTA111 Enhanced SCAN bridge Multidrop Addressable IEEE 1149.1 (JTAG) Port April 2004 SCANSTA111 Enhanced SCAN bridge Multidrop Addressable IEEE 1149.1 (JTAG) Port General Description The SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a multidrop approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to the remaining modules. Each SCANSTA111 supports up to 3 local IEEE1149.1 scan rings which can be accessed individually or bined serially. Addressing is acplished by loading the instruction register with a value matching that of the Slot...