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SCANSTA111 - Enhanced SCAN bridge Multidrop Addressable IEEE 1149.1 (JTAG) Port

Description

The SCANSTA111 extends the IEEE Std.

1149.1 test bus into a multidrop test bus environment.

The advantage of a multidrop approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to the remaining modules.

Features

  • n True IEEE 1149.1 hierarchical and multidrop addressable capability n The 7 slot inputs support up to 121 unique addresses, an Interrogation Address, Broadcast Address, and 4 Multi-cast Group Addresses (address 000000 is reserved) Connection Diagrams 10124516 10124502 © 2004 National Semiconductor Corporation DS101245 www. national. com SCANSTA111 TABLE 1. Glossary LFSR LSP Local Linear Feedback Shift Register. When enabled, will generate a 16-bit signature of sampled serial test data. Lo.

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Datasheet Details

Part number SCANSTA111
Manufacturer National Semiconductor
File Size 524.14 KB
Description Enhanced SCAN bridge Multidrop Addressable IEEE 1149.1 (JTAG) Port
Datasheet download datasheet SCANSTA111 Datasheet
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Full PDF Text Transcription

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SCANSTA111 Enhanced SCAN bridge Multidrop Addressable IEEE 1149.1 (JTAG) Port April 2004 SCANSTA111 Enhanced SCAN bridge Multidrop Addressable IEEE 1149.1 (JTAG) Port General Description The SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a multidrop approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to the remaining modules. Each SCANSTA111 supports up to 3 local IEEE1149.1 scan rings which can be accessed individually or combined serially. Addressing is accomplished by loading the instruction register with a value matching that of the Slot inputs.
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