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SCANSTA111 Datasheet Enhanced SCAN bridge Multidrop Addressable IEEE 1149.1 (JTAG) Port

Manufacturer: National Semiconductor (now Texas Instruments)

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General Description

The SCANSTA111 extends the IEEE Std.

1149.1 test bus into a multidrop test bus environment.

The advantage of a multidrop approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to the remaining modules.

Overview

SCANSTA111 Enhanced SCAN bridge Multidrop Addressable IEEE 1149.1 (JTAG) Port April 2004 SCANSTA111 Enhanced SCAN bridge Multidrop Addressable IEEE 1149.

Key Features

  • n True IEEE 1149.1 hierarchical and multidrop addressable capability n The 7 slot inputs support up to 121 unique addresses, an Interrogation Address, Broadcast Address, and 4 Multi-cast Group Addresses (address 000000 is reserved) Connection Diagrams 10124516 10124502 © 2004 National Semiconductor Corporation DS101245 www. national. com SCANSTA111 TABLE 1. Glossary LFSR LSP Local Linear Feedback Shift Register. When enabled, will generate a 16-bit signature of sampled serial test data. Lo.

📁 Similar Datasheet

Brand Logo Part Number Description Manufacturer
Texas Instruments Logo SCANSTA111 Enhanced SCAN Bridge Multidrop Addressable IEEE 1149.1 Port Texas Instruments

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