The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE™ testability integrated-circuit family.
This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies.
| Part number | SN54BCT8240A |
|---|---|
| Manufacturer | Texas Instruments |
| File Size | 488.19 KB |
| Description | SCAN TESTER |
| Datasheet |
 SN54BCT8240A Datasheet
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| Part Number | Description | Manufacturer |
|---|---|---|
| SN54HC595J | 16-bit bus transceiver and transparant D-type latch | nexperia |
| SN54LS00 | QUAD 2-INPUT NAND GATE | Motorola Inc |
| SN54LS01 | QUAD 2-INPUT NAND GATE | Motorola Inc |
| SN54LS02 | QUAD 2-INPUT NOR GATE | Motorola Inc |
| SN54LS03 | QUAD 2-INPUT NAND GATE | Motorola Inc |
| Part Number | Description |
|---|---|
| SN54BCT8244A | SCAN TESTER |
| SN54BCT8245A | SCAN TESTER |
| SN54BCT8373A | SCAN TESTER |
| SN54BCT8374A | SCAN TESTER |
| SN54BCT125A | QUADRUPLE BUS BUFFER GATES |
The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.
