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SN54BCT8373A - SCAN TESTER

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SN54BCT8373A Product details

Description

The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE™ testability integratedcircuit family.

This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies.

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