Datasheet Details
| Part number | SN54BCT8373A |
|---|---|
| Manufacturer | Texas Instruments |
| File Size | 488.69 KB |
| Description | SCAN TESTER |
| Datasheet | SN54BCT8373A-etcTI.pdf |
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Overview: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Octal Test-Integrated Circuits D Functionally Equivalent to ’F373 and ’BCT373 in the Normal-Function Mode D patible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Test Operation Synchronous to Test Access Port (TAP) D Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage (10 V ) on TMS Pin D SCOPE ™ Instruction Set – IEEE Standard 1149.
| Part number | SN54BCT8373A |
|---|---|
| Manufacturer | Texas Instruments |
| File Size | 488.69 KB |
| Description | SCAN TESTER |
| Datasheet | SN54BCT8373A-etcTI.pdf |
|
|
|
The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE™ testability integratedcircuit family.
This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of plex circuit board assemblies.
Scan access to the test circuitry is acplished via the 4-wire test access port (TAP) interface.
| Part Number | Description |
|---|---|
| SN54BCT8374A | SCAN TESTER |
| SN54BCT8240A | SCAN TESTER |
| SN54BCT8244A | SCAN TESTER |
| SN54BCT8245A | SCAN TESTER |
| SN54BCT125A | QUADRUPLE BUS BUFFER GATES |
| SN54BCT126A | QUADRUPLE BUS BUFFER GATES |
| SN54BCT2240 | OCTAL BUFFERS AND LINE/MOS DRIVERS |
| SN54BCT2244 | OCTAL BUFFERS AND LINE/MOS DRIVERS |
| SN54BCT240 | OCTAL BUFFERS/DRIVERS |
| SN54BCT244 | Octal Buffers/Drivers |