SN54BCT8373A datasheet by Texas Instruments.
| Part number | SN54BCT8373A |
|---|---|
| Datasheet | SN54BCT8373A-etcTI.pdf |
| File Size | 488.69 KB |
| Manufacturer | Texas Instruments |
| Description | SCAN TESTER |
|
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The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE™ testability integratedcircuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of plex circuit board assemblies. Scan access to the test circuitry is acplished via the 4-wire test access port (TAP) interface.
View all Texas Instruments datasheets
| Part Number | Description |
|---|---|
| SN54BCT8374A | SCAN TESTER |
| SN54BCT8240A | SCAN TESTER |
| SN54BCT8244A | SCAN TESTER |
| SN54BCT8245A | SCAN TESTER |
| SN54BCT125A | QUADRUPLE BUS BUFFER GATES |
| SN54BCT126A | QUADRUPLE BUS BUFFER GATES |
| SN54BCT2240 | OCTAL BUFFERS AND LINE/MOS DRIVERS |
| SN54BCT2244 | OCTAL BUFFERS AND LINE/MOS DRIVERS |
| SN54BCT240 | OCTAL BUFFERS/DRIVERS |
| SN54BCT244 | Octal Buffers/Drivers |
