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D Controlled Baseline
− One Assembly/Test Site, One Fabrication Site
D Extended Temperature Performance of Up
To −55°C to 125°C
D Enhanced Diminishing Manufacturing
Sources (DMS) Support
D Enhanced Product-Change Notification D Qualification Pedigree† D 3-State Outputs Drive Bus Lines or Buffer
Memory Address Registers
D High-Current Outputs Drive Up To 15
LSTTL Loads
† Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.
SN74HC244-EP Datasheet
