SN74LVC1G86-EP Datasheet | Texas Instruments

.ti. Features - Controlled Baseline - One Assembly/Test Site, One Fabrication Site - Extended Temperature Performance of -55°C to 125°C - Enhanced Diminishing Manufacturing Sources (DMS) Support - Enhanced Product-Change Notification - Qualification Pedigree (1) - Supports 5-V VCC Operation - Inputs Accept Voltages to 5.5 V - Max tpd of 6.7 ns at 3.3 V - Low Power Consumption, 15-μA Max ICC - ±24-m A Output Drive at 3.3 V - Ioff Supports Partial-Power-Down Mode Operation (1) ponent qualification in accordance with JEDEC and industry standards to ensure reliable operation over specified temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold pound life. Such qualification testing should not be viewed as justifying use of this ponent beyond specified performance and environmental limits. SN74LVC1G86-EP SINGLE 2-INPUT EXCLUSIVE-OR GATE SCES679 - JULY 2007 - Latch-Up Performance Exceeds 100 m A Per JESD 78, Class II - ESD Protection Exceeds JESD 22 - 2000-V Human-Body Model (A114-A) - 200-V Machine Model (A115-A) - 1000-V Charged-Device Model (C101) DCK PACKAGE (TOP VIEW) A 1 5 VCC B2 GND 3 4 Y See mechanical drawings for dimensions. DESCRIPTION/ORDERING...