SN74LVC2G80 Datasheet | Texas Instruments

.ti. SCES309F - DECEMBER 2001 - REVISED DECEMBER 2013 Dual Positive-Edge-Triggered D-Type Flip-Flop Check for Samples: SN74LVC2G80 Features - 2 Available in the Texas Instruments Nano Free™ Package - Supports 5-V VCC Operation - Inputs Accept Voltages to 5.5 V - Max tpd of 4.2 ns at 3.3 V - Low Power Consumption, 10-μA Max ICC - Typical VOLP (Output Ground Bounce) <0.8 V at VCC = 3.3 V, TA = 25°C - Typical VOHV (Output VOH Undershoot) >2 V at VCC = 3.3 V, TA = 25°C - Ioff Feature Supports Live Insertion, Partial- Power-Down and Back Drive Protection Mode Operation - Latch-Up Performance Exceeds 100 m A Per JESD 78, Class II - ESD Protection Exceeds JESD 22 - 2000-V Human-Body Model (A114-A) - 200-V Machine Model (A115-A) - 1000-V Charged-Device Model (C101) DESCRIPTION This dual positive-edge-triggered D-type flip-flop is designed for 1.65-V to 5.5-V VCC operation. When data at the data (D) input meets the setup time requirement, the data is transferred to the Q output on the positive-going edge of the clock pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the clock pulse. Following the hold-time interval, data at the D input can be changed without affecting the levels at the outputs. Nano Free™ package technology is a major breakthrough in IC packaging concepts, using the die as the package. This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down. 1CLK 1D 2Q DCT PACKAGE (TOP...