Datasheet4U Logo Datasheet4U.com

SN74LVC2G00W-EP - DUAL 2-INPUT POSITIVE-NAND GATE

Description

This dual 2-input positive-NAND gate is designed for 1.65-V to 5.5-V VCC operation.

B or Y = A + B in positive logic.

This device is fully specified for partial-power-down applications using Ioff.

Features

  • Controlled Baseline.
  • One Assembly/Test Site, One Fabrication Site.
  • Extended Temperature Performance of.
  • 55°C to 115°C.
  • Enhanced Diminishing Manufacturing Sources (DMS) Support.
  • Enhanced Product-Change Notification.
  • Qualification Pedigree (1).
  • Supports 5-V VCC Operation.
  • Inputs Accept Voltages to 5.5 V.
  • Max tpd of 5.3 ns at 3.3 V.
  • Low Power Consumption, 10-µA Max ICC (1) Component qualification in a.

📥 Download Datasheet

Datasheet preview – SN74LVC2G00W-EP

Datasheet Details

Part number SN74LVC2G00W-EP
Manufacturer Texas Instruments
File Size 120.77 KB
Description DUAL 2-INPUT POSITIVE-NAND GATE
Datasheet download datasheet SN74LVC2G00W-EP Datasheet
Additional preview pages of the SN74LVC2G00W-EP datasheet.

📁 Similar Datasheet

  • SN74LVC1G125 - high performance non-inverting buffer (UMW)
  • SN74LVC1G34 - Single buffer (UMW)
  • SN74L71 - AND-Gate R-S Master-Slave F-F (National Semiconductor)
  • SN74L74N - Dual D-Type Flip-Flop (ETC)
  • SN74LS00 - QUAD 2-INPUT NAND GATE (Motorola)
  • SN74LS00 - Quad 2-Input NAND Gate (ON Semiconductor)
  • SN74LS02 - QUAD 2-INPUT NOR GATE (Motorola)
  • SN74LS02 - QUAD 2-INPUT NOR GATE (ON Semiconductor)
  • SN74LS04 - Hex Inverter (ON Semiconductor)
  • SN74LS04 - HEX INVERTER (Motorola)
Other Datasheets by Texas Instruments

Full PDF Text Transcription

Click to expand full text
www.ti.com FEATURES • Controlled Baseline – One Assembly/Test Site, One Fabrication Site • Extended Temperature Performance of –55°C to 115°C • Enhanced Diminishing Manufacturing Sources (DMS) Support • Enhanced Product-Change Notification • Qualification Pedigree (1) • Supports 5-V VCC Operation • Inputs Accept Voltages to 5.5 V • Max tpd of 5.3 ns at 3.3 V • Low Power Consumption, 10-µA Max ICC (1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.
Published: |